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 GT20J321
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Chanenel IGBT
GT20J321
High Power Switching Applications Fast Switching Applications
* * * The 4th generation Enhancement-mode Fast switching (FS): Operating frequency up to 50 kHz (reference) High speed: tf = 0.04 s (typ.) Low switching loss * * : Eon = 0.40 mJ (typ.) : Eoff = 0.43 mJ (typ.) Low saturation voltage: VCE (sat) = 2.0 V (typ.) FRD included between emitter and collector Unit: mm
Maximum Ratings (Ta = 25C)
Characteristics Collector-emitter voltage Gate-emitter voltage Collector current Emitter-collector forward current Collector power dissipation (Tc = 25C) Junction temperature Storage temperature range DC 1 ms DC 1 ms Symbol VCES VGES IC ICP IF IFM PC Tj Tstg Rating 600 20 20 40 20 40 45 150 -55 to 150 Unit V V A
JEDEC JEITA TOSHIBA
2-10R1C
A W C C
Weight: 1.7 g (typ.)
Thermal Characteristics
Characteristics Thermal resistance (IGBT) Thermal resistance (diode) Symbol Rth (j-c) Rth (j-c) Max 2.78 4.23 Unit C/W C/W
Equivalent Circuit
Collector
Gate Emitter
1
2002-04-08
GT20J321
Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Collector cut-off current Gate-emitter cut-off voltage Collector-emitter saturation voltage Input capacitance Turn-on delay time Rise time Switching time Turn-on time Turn-off delay time Fall time Turn-off time Turn-on switching loss Turn-off switching loss Symbol IGES ICES VGE (OFF) VCE (sat) Cies td (on) tr ton td (off) tf toff Eon Eoff VF trr IF = 20 A, VGE = 0 IF = 20 A, di/dt = -100 A/s Inductive Load VCC = 300 V, IC = 20 A VGG = +15 V, RG = 33 (Note 1) (Note 2) Test Condition VGE = 20 V, VCE = 0 VCE = 600 V, VGE = 0 IC = 2 mA, VCE = 5 V IC = 20 A, VGE = 15 V VCE = 10 V, VGE = 0, f = 1 MHz Min 3.5 Typ. 2.0 3000 0.06 0.04 0.17 0.24 0.04 0.34 0.40 0.43 100 Max 500 1.0 6.5 2.45 mJ 2.1 V ns s Unit nA mA V V pF
Switching loss
Peak forward voltage Reverse recovery time
Note 1: Switching time measurement circuit and input/output waveforms
VGE 0 -VGE IC RG VCE 0 VCE 10% td (off) toff 10% tf 10% td (on) 10% tr ton L VCC IC 90% 90%
90% 10%
Note 2: Switching loss measurement waveforms
VGE 0
90% 10%
IC VCE Eoff Eon 5%
0
2
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GT20J321
IC - VCE
40 Common emitter Tc = 25C 9 20 15 20
VCE - VGE
Common emitter Tc = -40C
(V) Collector-emitter voltage VCE
16 12 8
(A) Collector current IC
30
20
8 40 10 4 IC = 5 A 0 0 4 8 12 16 20 20
10 VGE = 7 V
0 0
1
2
3
4
5
Collector-emitter voltage VCE
(V)
Gate-emitter voltage
VGE
(V)
VCE - VGE
20 Common emitter Tc = 25C 20
VCE - VGE
Common emitter Tc = 125C
(V)
Collector-emitter voltage VCE
12
Collector-emitter voltage VCE
16
(V)
16 12
8
40 10 20
8 10 4 IC = 5 A 0 0
40 20
4 IC = 5 A 0 0 4 8 12 16 20
4
8
12
16
20
Gate-emitter voltage
VGE
(V)
Gate-emitter voltage
VGE
(V)
IC - VGE
40 5 Common emitter VCE = 5 V Common emitter VGE = 15 V
VCE (sat) - Tc
Collector-emitter saturation voltage VCE (sat) (V)
(A)
4
30
IC
40 3 30 20 10 1 IC = 5 A
Collector current
20
2
10 Tc = 125C -40 25 0 0 4 8 12 16 20
0 -60
-20
20
60
100
140
Gate-emitter voltage
VGE
(V)
Case temperature Tc
(C)
3
2002-04-08
GT20J321
Switching time ton, tr, td (on) - RG
3 Common emitter VCC = 300 V VGG = 15 V IC = 20 A : Tc = 25C : Tc = 125C (Note 1) 3
Switching time ton, tr, td (on) - IC
Common emitter VCC = 300 V VGG = 15 V RG = 33 : Tc = 25C : Tc = 125C (Note 1)
(s)
ton, tr, td (on)
1
(s)
1
0.3 ton 0.1 td (on) tr 0.03
ton, tr, td (on)
0.3 ton td (off) 0.03 tr
Switching time
Switching time
10 30 100 300 1000
0.1
0.01 1
3
0.01 0
4
8
12
16
20
Gate resistance RG
()
Collector current
IC
(A)
Switching time toff, tf, td (off) - RG
10 Common emitter VCC = 300 V VGG = 15 V IC = 20 A : Tc = 25C : Tc = 125C (Note 1) 10
Switching time toff, tf, td (off) - IC
Common emitter VCC = 300 V VGG = 15 V RG = 33 : Tc = 25C : Tc = 125C (Note 1)
(s)
3
(s)
3
toff, tf, td (off)
1
toff, tf, td (off)
1 td (off)
toff
0.3 td (off) 0.1
toff
0.3
Switching time
Switching time
0.1
tf
0.03 tf 0.01 1 3 10 30 100 300 1000
0.03
0.01 0
4
8
12
16
20
Gate resistance RG
()
Collector current
IC
(A)
Switching loss
10 Common emitter VCC = 300 V VGG = 15 V IC = 20 A : Tc = 25C : Tc = 125C (Note 2)
Eon, Eoff - RG
10
Switching loss
Common emitter VCC = 300 V VGG = 15 V IC = 20 A : Tc = 25C : Tc = 125C (Note 2) Eon 0.3
Eon, Eoff - IC
(mJ)
(mJ) Eon, Eoff Switching loss
Eon
3
3
Eon, Eoff
1
1
Switching loss
0.3
Eoff
0.1
Eoff
0.1 1
3
10
30
100
300
1000
0.03 0
4
8
12
16
20
Gate resistance RG
()
Collector current
IC
(A)
4
2002-04-08
GT20J321
C - VCE
10000 3000 500
VCE, VGE - QG
(V)
Cies Common emitter RL = 15 Tc = 25C 20
C
100 Coes 30 10 3 1 Common emitter VGE = 0 f = 1 MHz Tc = 25C 3 10 30 100
300 200 VCE = 100 V 100 200 4 8
Cres
300
1000
0 0
20
40
60
80
100
120
0 140
Collector-emitter voltage VCE
(V)
Gate charge
QG
(nC)
IF - VF
40 Common 100 collector VGE = 0 Common collector di/dt = -100 A/s VGE = 0 : Tc = 25C : Tc = 125C
trr, Irr - IF
1000
(A)
(A)
Irr
30
Reverse recovery current
IF
20 Tc = 125C 25 10 -40 0 0
10
trr
100
Irr 3 30
0.5
1
1.5
2
2.5
3
1 0
5
10
15
10 20
Forward voltage
VF
(V)
Forward current
IF
(A)
Safe Operating Area
100 IC max (pulse)* 100
Reverse Bias SOA
(A)
IC
Collector current
Collector current
DC operation 3 *: Single pulse 1 Tc = 25C Curves must be 0.3 derated linearly with increase in temperature. 0.1 1 3 10 30 100 300 1000 10 ms* 1 ms*
IC
10
(A)
30 IC max (continuous)
50 s*
30
100 s*
10
3
1
0.3
0.1 1
Tj 125C VGE = 15 V RG = 33 3 10 30 100 300 1000
Collector-emitter voltage VCE
(V)
Collector-emitter voltage VCE
(V)
5
2002-04-08
Reverse recovery time
Forward current
trr
30
300
(ns)
Gate-emitter voltage
300
300
12
Capacitance
VGE
1000
Collector-emitter voltage VCE
400
16
(pF)
(V)
GT20J321
(C/W)
10
2
rth (t) - tw
10
1 FRD 0 IGBT
rth (t)
10
Transient thermal resistance
10
-1
10
-2
10
-3 Tc = 25C -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 10 2
10
-4 10
Pulse width
tw
(s)
6
2002-04-08
GT20J321
RESTRICTIONS ON PRODUCT USE
000707EAA
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice.
7
2002-04-08


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